Investigating the Electromechanical Behavior of Unconventionally Ferroelectric Hf <sub>0.5</sub> Zr <sub>0.5</sub> O <sub>2</sub> ‐Based Capacitors Through Operando Nanobeam X‐Ray Diffraction
نویسندگان
چکیده
Understanding various aspects of ferroelectricity in hafnia-based nanomaterials is vital importance for the development future nonvolatile memory and logic devices. Here, unconventional weak electromechanical response epitaxial La0.67Sr0.33MnO3/Hf0.5Zr0.5O2/La0.67Sr0.33MnO3 ferroelectric capacitors investigated, via sensitivity offered by nanobeam X-ray diffraction experiments during application electrical bias. It shown that pristine rhombohedral phase exhibits a linear piezoelectric effect with coefficient (|d33|) ≈ 0.5–0.8 pmV−1. found suppressed above coercive voltage. For higher voltages, onset DC conductivity throughout capacitor, second-order observed. The work sheds light into Hf0.5Zr0.5O2 suggests its (un)correlation switching.
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ژورنال
عنوان ژورنال: Advanced electronic materials
سال: 2023
ISSN: ['2199-160X']
DOI: https://doi.org/10.1002/aelm.202201298